Friday, March 17, 2017

Angstrom Advanced AA2000 Atomic Force Microscope

Features
High Performance:
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function:
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation:
  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Specifications

 

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