2013 International Biomass Conference
April 9th 2013 Minneapolis, MN, United States
Angstrom Advanced Inc was invited to Minneapolis, MN to speak about the future of using Hydrogen (Steam Reforming and PSA technology) to improve Biomass development and economy, at the 2013 International Biomass Conference and Expo.
"Today we focus on hydrogen-from-biomass. As a renewable energy source, biomass can either be used directly, or indirectly—once or converted into another type of energy product such as bio-fuel.
By processing biomass through various routes, we can get lots of products such as bio oil, biogas, biodiesel, ethanol… but it’s better to transform them further to hydrogen through reforming reaction while collecting the carbon dioxide meanwhile.
The most important reason we adopt hydrogen as final energy carrier instead of other forms is the inherit properties of hydrogen:1) clean, 2) inexhaustible, 3) high energy density. " More articles will be released about using Hydrogen in Biomass projects. Please pay attention to our press releases.
Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Our instruments and plants have been delivered to many renowned organizations. As the Three-Time “Best of Boston” Award Winner. Angstrom Advanced goal is to provide our customers with the best products with highest standard of service at cost efficient pricing. Angstrom Advanced now provides several product lines including Spectrophotometer, X-ray Diffractometer, Gas Generator, Atomic Force Microscope/Scanning Probe Microscope, Hydrogen Generating Plant and Nitrogen Generating Plant. Angstrom Advanced corporate headquarters are located in Massachusetts, USA. We have numerous partnerships, representatives in countries around the world.
Angstrom Advanced delivers a reputable and highly efficient world accepted Hydrogen and Nitrogen Generating Plants for refinery, petrochemical and other industrial applications. Angstrom Advanced services for Hydrogen Plant projects typically include conceptual design, detailed engineering, procurement, fabrication, construction, start-up and operational training. The production line of Gas Generators includes Hydrogen Plant, Nitrogen Plant and Air Plant. The combination Plants for both Hydrogen and Nitrogen, and Air and Hydrogen are available. These generators have state of the art technology, stability and functionality for scientific instruments, industry and solar and wind energy. Angstrom Advanced provide a lump-sum, turnkey solution, handling everything from concept to start-up with our own resources whenever possible.
Angstrom Advanced Hydrogen Generating Plant product line include technologies such as:
- Hydrogen Plant by Water Electrolysis
- Hydrogen Plant by Natural Gas Steam Reforming
- Hydrogen Plant by Pressure Swing Adsorption with Purifying System
- Hydrogen Plant by Ammonia Decomposition with Purifying System
- Hydrogen Plant by Methanol Decomposition
Angstrom Advanced offers gas and liquid Nitrogen Generating Plants from 0.5 m3/hr to 10000 m3/hr. Angstrom Advanced is on the forefront of technologies for Pressure Swing Adsorption (PSA) and Membrane Separation and providing turn-key nitrogen generation projects to meet different industrial applications. We also offer Nitrogen Purifying System to purify the nitrogen up to 99.9995%. Nitrogen/Oxygen Plant by Pressure Swing Adsorption (PSA).
Angstrom Advanced Nitrogen Generating Plant product line include technologies such as:
Angstrom Advanced Nitrogen Generating Plant product line include technologies such as:
- Nitrogen Plant by Membrane Separation
- Nitrogen Purifying System
- Liquid Nitrogen, Oxygen, Argon Plant by Cryogenic Technology
Angstrom Advanced Atomic Force Microscope / Scanning Probe Microscope include AFM, SPM, STM, LFM, EFM. All of Angstrom Advanced microscope line-up bring state the art technology to meet the most advanced applications and are designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor inside the system, Angstrom Advanced systems can handle complicated multi-functional tasks efficiently. Angstrom Advanced Atomic Force Microscopes (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode, Lateral Force Microscope (LFM), Scanning Tunneling Microscope (STM), Conductive AFM, SPM in liquid, Environmental Control SPM, Nano-Processing System including Lithography Mode and Vector Scan Mode.
Angstrom Advanced has been bringing forth the latest advancements in all fields of technology and was founded by a group of engineers that realized the importance to research and development for the better of mankind. Angstrom Advanced location in the heart of high technology schools and Institutes made us a leading developer and manufacturer of Scientific instrument s. Angstrom Advanced instruments have been delivered to many renowned universities, research institutes and companies worldwide. Angstrom Advanced goal is to supply the most accurate and sustainable scientific instrument with the highest standard of customer satisfaction.
Learn more by going on our website: www.angstromadvancedinc.com
The Path to Hydrogen:
Producing clean, storable fuel from biomass.
April 5th 2013 Boston, United States
North America Clean Energy, the leading magazine and internet media in Renewable Energy sector published again an article from us about our innovative collaboration of Hydrogen and Biomass technology. "A new application of hydrogen is being deployed which is helping solve humanity’s ever-evolving energy woes. Traditionally, hydrogen has a large number of applications – used in everything from industrial products to food packaging. Ammonia used in fertilizer and industrial processes amounted to 160 Million tons worldwide in 2011; hydrogen is a primary component in ammonia. The market demand for new, less expensive sources of hydrogen is driven heavily by fertilizer and manufacturing, however, a new market demand is emerging for hydrogen in another sector – energy. Power plants in Germany as well as Canada (using wind and natural gas, respectively) are today supplementing their primary electrical generators with advanced configurations of hydrogen technologies. These retrofits help the plants save money by smoothing supply, converting excess electricity generated into storable hydrogen gas which can be returned to electricity using a turbine generator or a fuel cell. " (The drawing is referred to a famous biomass manufacturer, Nexterra)
Click here to learn more about this article.
Distributed Energy Article about Angstrom Advanced Inc
Feb 25th 2013 Boston, United States
The leading clean energy magazine "Distributed Energy" has recently published an article about the cutting-edge technology Angstrom Advanced has developed to specially serve the Distributed Renewable Energy market: "Hydrogen is a very valuable alternative to fossil fuel for distributed energy generation, delivering a high-powered solution with minimal environmental and safety concerns. Green businesses, telecomm providers, governments, and renewable energy advocates can now produce on-demand energy for their assets, at minimal cost and using commercially available equipment. This article will look at the benefits associated with hydrogen and fuel cell energy systems compared to fossil fuel and chemical alternatives as well as the inherent costs associated with a fuel cell on-demand generator. This analysis will show that it is not only technically feasible to use hydrogen for on-demand energy in certain, but also that it can be more economic than the alternatives. Diesel generators are valuable when used only for applications that have short run times (less than eight hours per day) and where they are in proximity to a low-cost fuel source. For longer run times, and when used in more remote and extreme conditions, renewable hydrogen generators are an ideal solution for providing on-demand energy...
Click here to read more about this article
Monday, December 9, 2013
AFM Scanners
The sample is placed on the Piezo Electric Scanner and is scanned under a stationary cantalever tip (there are AFM models in which the tip is scanned over a stationary sample). The PES is a very precise component and is able to accuratly move the sample through a scan (a back and forth raster pattern) of only a few hundred nanometers. Scanners are made of piezo tubes and are steady held in the SPM base.Voltage applied to piezoelectric scanner tube housed inside moves sample precise increments back and forth. Size at bottom indicates maximum size scan possible,each scanner has its own specified parameters.
Samples are held in place on the scanner with a removable cap.Piezo scanner can extend and retract 3-dimentionally based on the applied X, Y and Z voltage placed across the individual elements.
Samples are held in place on the scanner with a removable cap.Piezo scanner can extend and retract 3-dimentionally based on the applied X, Y and Z voltage placed across the individual elements.
Atomic Force Microscope and Scanning Force Microscope Probes
Different kinds of probes can be used in an Atomic Force Microscope. Proper probe selection depends on sample characteristics and system conditions.
Metal Probes
Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).
Cantilever Probes
A flexible cantilever with an atomic-sharp tip is widely used in AFM as below.
Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size.
Different samples and system conditions required different cantilevers.
Contact Mode: Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different Force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.
Tapping Mode: A oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.
Metal Probes
Probe used in STM must be conductive and a atomic-sharp tip is required. STM tips can be obtain by simply cut (for Pt-Ir) and electronically eroded (for tungsten).
Cantilever Probes
A flexible cantilever with an atomic-sharp tip is widely used in AFM as below.
Most cantilever probes are made by Si or SiN with different types of coatings and different shape and size.
Different samples and system conditions required different cantilevers.
Contact Mode: Theoretically all kinds of cantilever probes can be used in contact mode. But because of the different Force constant parameters, harder cantilever will cause the sample damages with the same amount of deflection.
Tapping Mode: A oscillating cantilever is required in Tapping mode. So theoretically using cantilevers with higher resonance frequency will give better resolution. Cantilevers with larger force constant and higher resonance frequency (normally over 200kHz) should be chosen.
Atomic Force Microscope and Scanning Force Microscope Software
The Software is available with the following data types of images
AFM Contact Mode:
Topography — the rise and fall of the sample surface.
Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can
be reflected by the Photodectetor’s Up-Down signal.
Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal.
AFM Tapping Mode:
Topography — he rise and fall of the sample surface.
Amplitude — antilever oscillating amplitude changes because of the rise and fall of sample topography.
Phase — cantilever oscillating phase changes because of the sample material characteristics.
Scanning Tunneling Microscope:
Topography —the rise and fall of the sample surface.
Current — Tunneling current changes between tip and sample surface.
AFM Contact Mode:
Topography — the rise and fall of the sample surface.
Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can
be reflected by the Photodectetor’s Up-Down signal.
Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the Photodectetor’s Left-Right signal.
AFM Tapping Mode:
Topography — he rise and fall of the sample surface.
Amplitude — antilever oscillating amplitude changes because of the rise and fall of sample topography.
Phase — cantilever oscillating phase changes because of the sample material characteristics.
Scanning Tunneling Microscope:
Topography —the rise and fall of the sample surface.
Current — Tunneling current changes between tip and sample surface.
Atomic Force Microscope and Scanning Force Microscope Tipholders
AFM Tipholder:
1 Tip holder Handle 2 Spring Clip which secure the cantilever 3 Cantilever notch STM Tipholder: 1 Tip holder Handle 2 Installation tube for Pt-Ir or tungsten tips |
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Atomic Force Microscope and Scanning Force Microscope Head
AFM Head holds the following components:
XY Translation Stage: Holds probe head, movable in XY direction by XY translation screws and in Z direction by controls in software
Position Sensitive Photo detector (PSPD): Detects laser deflections, which is then converted into a topographical map
PSPD adjustment screws: controls position of PSPD; screw on left controls up and down adjustment; screw on right controls left right adjustment
Laser Beam Steering Screws: controls position of laser on back of cantilever
XY Translation Stage: Holds probe head, movable in XY direction by XY translation screws and in Z direction by controls in software
Position Sensitive Photo detector (PSPD): Detects laser deflections, which is then converted into a topographical map
PSPD adjustment screws: controls position of PSPD; screw on left controls up and down adjustment; screw on right controls left right adjustment
Laser Beam Steering Screws: controls position of laser on back of cantilever
Atomic Force Microscope and Scanning Force Microscope Controller
The SPM Controller handles all SPM electronics such as signal processing and feedback programming.
The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer.
At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.
The Controller inputs commands from a control computer via 60 pin cable and outputs the control signals that are needed for operating an AFM stage. Additional signals from the stage are relayed through the SPM Controller via the Network cable to the control computer.
At the rear of the Controller, in addition to the Network cable connection, there are two input/output ribbon cables. A 60-pin cable is used to send and receive signals from the microscope stage. A second 50-pin cable is used for accessing all of SPM Controllers signals for testing or experimentation.
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Base of Atomic Force Microscope and Scanning Force Microscope
The base of Atomic Force Microscope holds the detector,AFM Head.It also has environmental control attachment
along with other optional attachments such as Vibration Isolation System.
AFM |
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Types of Atomic Force Microscope
Atomic force microscopy (AFM)
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In newer more advanced versions, currents can even be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with very few research groups reporting reliable data.
Scanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981.
Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.
The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of techniques "piezoelectric techniques". The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.
Scanning Tunneling Microscope (STM)
A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer (at IBM Zürich), the Nobel Prize in Physics in 1986. For an STM, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated. The STM can be used not only in ultra high vacuum but also in air, water, and various other liquid or gas ambients, and at temperatures ranging from near zero kelvin to a few hundred degrees Celsius.
The STM is based on the concept of quantum tunneling. When a conducting tip is brought very near to the surface to be examined, a bias (voltage difference) applied between the two can allow electrons to tunnel through the vacuum between them. The resulting tunneling current is a function of tip position, applied voltage, and the local density of states (LDOS) of the sample. Information is acquired by monitoring the current as the tip's position scans across the surface, and is usually displayed in image form. STM can be a challenging technique, as it requires extremely clean and stable surfaces, sharp tips, excellent vibration control, and sophisticated electronics.
Magnetic force microscope (MFM)
Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip is scanning the magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction.
Electrostatic force microscopy (EFM)
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-ranged force and can be detected 100 nm from the sample. For example, consider a conductive cantilever tip and sample which are separated a distance z usually by a vacuum. A bias voltage between tip and sample is applied by an external battery forming a capacitor between the two. The capacitance of the system depends on the geometry of the tip and sample.
Conductive atomic force microscopy (C-AFM)
Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current. This enables to correlate a spatial feature on the sample with its conductivity, and distinguishes C-AFM from STM where only current is recorded. A C-AFM microscope uses conventional silicon tips coated with a metal or metallic alloy, such as Pt-Ir alloy.
Lateral Force Microscopy (LFM)
Lateral Force Microscopy (LFM) measures the deflection of the cantilever in the horizontal direction . The lateral deflection of the cantilever is a result of the force applied to the cantilever when it moves horizontally across the sample surface,and the magnitude of this deflection is determined by the frictional coefficient, the topography of the sample surface, the direction of the cantilever movement, and the cantilever’s lateral spring constant. Lateral Force Microscopy is very useful for studying a sample whose surface consists of inhomogeneous compounds. It is also used to enhance contrast at the edge of an abruptly changing slope of a sample surface, or at a boundary between different compounds.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In newer more advanced versions, currents can even be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with very few research groups reporting reliable data.
Scanning Probe Microscopy (SPM)
Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981.
Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.
The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of techniques "piezoelectric techniques". The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.
Scanning Tunneling Microscope (STM)
A scanning tunneling microscope (STM) is an instrument for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer (at IBM Zürich), the Nobel Prize in Physics in 1986. For an STM, good resolution is considered to be 0.1 nm lateral resolution and 0.01 nm depth resolution. With this resolution, individual atoms within materials are routinely imaged and manipulated. The STM can be used not only in ultra high vacuum but also in air, water, and various other liquid or gas ambients, and at temperatures ranging from near zero kelvin to a few hundred degrees Celsius.
The STM is based on the concept of quantum tunneling. When a conducting tip is brought very near to the surface to be examined, a bias (voltage difference) applied between the two can allow electrons to tunnel through the vacuum between them. The resulting tunneling current is a function of tip position, applied voltage, and the local density of states (LDOS) of the sample. Information is acquired by monitoring the current as the tip's position scans across the surface, and is usually displayed in image form. STM can be a challenging technique, as it requires extremely clean and stable surfaces, sharp tips, excellent vibration control, and sophisticated electronics.
Magnetic force microscope (MFM)
Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip is scanning the magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction.
Electrostatic force microscopy (EFM)
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges. It is a long-ranged force and can be detected 100 nm from the sample. For example, consider a conductive cantilever tip and sample which are separated a distance z usually by a vacuum. A bias voltage between tip and sample is applied by an external battery forming a capacitor between the two. The capacitance of the system depends on the geometry of the tip and sample.
Conductive atomic force microscopy (C-AFM)
Conductive atomic force microscopy (C-AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal-coated tip of the microscope and the conducting sample. Usual AFM topography, obtained by vibrating the tip, is acquired simultaneously with the current. This enables to correlate a spatial feature on the sample with its conductivity, and distinguishes C-AFM from STM where only current is recorded. A C-AFM microscope uses conventional silicon tips coated with a metal or metallic alloy, such as Pt-Ir alloy.
Lateral Force Microscopy (LFM)
Lateral Force Microscopy (LFM) measures the deflection of the cantilever in the horizontal direction . The lateral deflection of the cantilever is a result of the force applied to the cantilever when it moves horizontally across the sample surface,and the magnitude of this deflection is determined by the frictional coefficient, the topography of the sample surface, the direction of the cantilever movement, and the cantilever’s lateral spring constant. Lateral Force Microscopy is very useful for studying a sample whose surface consists of inhomogeneous compounds. It is also used to enhance contrast at the edge of an abruptly changing slope of a sample surface, or at a boundary between different compounds.
Knowledge base: Introduction of Atomic Force Microscope and Scanning Force Microscope
The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces, Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry.
Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm).If the tip was scanned at a constant height, a risk would exist that the tip collides with the surface, causing damage. The feedback mechanism is employed to adjust the tip-to-sample distance to maintain a constant force between the tip and the sample. The sample is mounted on a piezoelectric tube, that can move the sample in the z direction for maintaining a constant force, and the x and y directions for scanning the sample. The tip is mounted on a piezo scanner while the sample is being scanned in X and Y using another piezo block. The resulting map of the area z = f(x,y) represents the topography of the sample.
The AFM can be operated in a number of modes, depending on the application. In general, possible imaging modes are divided into contact modes and a non-contact modes where the cantilever is vibrated.
Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm).If the tip was scanned at a constant height, a risk would exist that the tip collides with the surface, causing damage. The feedback mechanism is employed to adjust the tip-to-sample distance to maintain a constant force between the tip and the sample. The sample is mounted on a piezoelectric tube, that can move the sample in the z direction for maintaining a constant force, and the x and y directions for scanning the sample. The tip is mounted on a piezo scanner while the sample is being scanned in X and Y using another piezo block. The resulting map of the area z = f(x,y) represents the topography of the sample.
The AFM can be operated in a number of modes, depending on the application. In general, possible imaging modes are divided into contact modes and a non-contact modes where the cantilever is vibrated.
Knowledge base: a short introduction to XRD
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Thursday, December 5, 2013
Angstrom Advanced Renewable Power Generating System Introduction
Because of its unique design in the electric system and controlling capability, Angstrom Renewable Power Generating System can adapt 100% fluctuating power from wind turbines/solar panels, and realize 100% utilization of renewable power during the hydrogen production.
Currently, this patented technology can be applied in 2NM3 – 1000NM3/Hour hydrogen generating systems, and therefore Angstrom Advanced Inc. could provide a variety of renewable energy generating systems, customized for different clients. This technology represents a bright future of massive production and utilization of hydrogen in the 21st century.
The Path to Hydrogen: Producing clean, storable fuel from biomass
April 5th 2013 Boston, United States
North America Clean Energy, the leading magazine and internet media in Renewable Energy sector published again an article from us about our innovative collaboration of Hydrogen and Biomass technology. "A new application of hydrogen is being deployed which is helping solve humanity’s ever-evolving energy woes. Traditionally, hydrogen has a large number of applications – used in everything from industrial products to food packaging. Ammonia used in fertilizer and industrial processes amounted to 160 Million tons worldwide in 2011; hydrogen is a primary component in ammonia. The market demand for new, less expensive sources of hydrogen is driven heavily by fertilizer and manufacturing, however, a new market demand is emerging for hydrogen in another sector – energy. Power plants in Germany as well as Canada (using wind and natural gas, respectively) are today supplementing their primary electrical generators with advanced configurations of hydrogen technologies. These retrofits help the plants save money by smoothing supply, converting excess electricity generated into storable hydrogen gas which can be returned to electricity using a turbine generator or a fuel cell. " (The drawing is referred to a famous biomass manufacturer, Nexterra)
Click here to learn more about this article.
Distributed Energy Article about Angstrom Advanced Inc
Feb 25th 2013 Boston, United States
The leading clean energy magazine "Distributed Energy" has recently published an article about the cutting-edge technology Angstrom Advanced has developed to specially serve the Distributed Renewable Energy market: "Hydrogen is a very valuable alternative to fossil fuel for distributed energy generation, delivering a high-powered solution with minimal environmental and safety concerns. Green businesses, telecomm providers, governments, and renewable energy advocates can now produce on-demand energy for their assets, at minimal cost and using commercially available equipment. This article will look at the benefits associated with hydrogen and fuel cell energy systems compared to fossil fuel and chemical alternatives as well as the inherent costs associated with a fuel cell on-demand generator. This analysis will show that it is not only technically feasible to use hydrogen for on-demand energy in certain, but also that it can be more economic than the alternatives. Diesel generators are valuable when used only for applications that have short run times (less than eight hours per day) and where they are in proximity to a low-cost fuel source. For longer run times, and when used in more remote and extreme conditions, renewable hydrogen generators are an ideal solution for providing on-demand energy...
Click here to read more about this article
Gas World Article about Angstrom Advanced Inc
Feb 25th 2013 Boston, United States
The leading Magazine in Biomass field, Gas World, published an article about the Hydrogen Reformer technology of Angstrom Advanced Inc. This is another recognition of Angstrom’s cutting edge technical innovation and its fast expanding fame in the industry: “Here and now gasification plants have the functionality to make the hydrogen economy a real possibility. Greatly reducing the cost of hydrogen production by using renewable resources and advanced, reliable processing techniques enables a gasification plant to produce valuable hydrogen product from waste materials. While the technology is available to enable this functionality, however, most plants opt to simply create SynGas (a mixture of hydrogen and carbon monoxide.) However, as market demand for hydrogen increases in parallel with the stationary and transportation fuel cell industry, gasification facilities will likely be the top producer of renewable hydrogen fuel – mostly due to the low cost of production and the scalability of plants. This paper will discuss minor changes to gasification plants that plant operators can implement which will maximize the value of their assets, and enable them to easily create a product with higher purity and productivity.
Click here to read more about this article
Angstrom is now providing Hydrogen Fueling Stations
Boston, United States
Angstrom now has the capability to provide the 50Kg/hour production capacity Hydrogen Fueling Stations, after collaborating with leading research organizations and national laboratories in the United States for years. This technology has made the Hydrogen Fueling Station ready for commercial operation around the world, and we are only waiting for the auto makers, such as Toyota, Honda, Daimler, Nissan, Audi and GM to release Hydrogen Fuel Cell Vehicles in the next a few years.
Not only can Angstrom supply commercial scale Hydrogen Fueling Station, but we also integrated with residential scale hydrogen fueling machine, which allows every family to enjoy using 100% clean energy for their gas, heating and electricity need at home.
Angstrom Advanced partnering with Ballard Corp
Braintree, United States
Braintree, Massachusetts, USA Feb 22, 2012 – Angstrom Advanced Inc, the leader in Hydrogen technology is collaborating with Ballard Corp. of Burnaby, BC Canada to bring ground-breaking renewable energy systems to the International markets. Combining Angstrom’s innovations in hydrogen generation/storage, and Ballard’s fuel cell technologies, the collaboration is bringing customers closer to creating their own “carbon-neutral” energy.
Hydrogen technology has advanced in recent years, and Angstrom is taking innovation to the next level. After having recently completed testing their patents with the National Renewable Energy Lab (NREL), Angstrom continues to push forward towards perfecting sustainable power systems using Hydrogen as a fuel carrier, the most abundant element on earth. Powered only by the fluctuating sources of sun or wind, the system is able to harness close to 100% of those sources to create immediate and stored power for any building over its lifetime.
With an open mindset and strong business relations, Angstrom is sure to be a leader in the new hydrogen economy. When many clients worldwide are looking to switch to Hydrogen, Angstrom Advanced Inc. analyzes the best avenues for design, build, and construction for each client. Having plants all around the world, Angstrom Advanced combines with technology from Ballard, and continues to make a difference for all citizens in the harnessing and long-term creation of clean energy
The Path to Hydrogen: Producing clean, storable fuel from biomass
April 5th 2013 Boston, United States
North America Clean Energy, the leading magazine and internet media in Renewable Energy sector published again an article from us about our innovative collaboration of Hydrogen and Biomass technology. "A new application of hydrogen is being deployed which is helping solve humanity’s ever-evolving energy woes. Traditionally, hydrogen has a large number of applications – used in everything from industrial products to food packaging. Ammonia used in fertilizer and industrial processes amounted to 160 Million tons worldwide in 2011; hydrogen is a primary component in ammonia. The market demand for new, less expensive sources of hydrogen is driven heavily by fertilizer and manufacturing, however, a new market demand is emerging for hydrogen in another sector – energy. Power plants in Germany as well as Canada (using wind and natural gas, respectively) are today supplementing their primary electrical generators with advanced configurations of hydrogen technologies. These retrofits help the plants save money by smoothing supply, converting excess electricity generated into storable hydrogen gas which can be returned to electricity using a turbine generator or a fuel cell. " (The drawing is referred to a famous biomass manufacturer, Nexterra)
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Gas World Article about Angstrom Advanced Inc
Feb 25th 2013 Boston, United States
The leading Magazine in Biomass field, Gas World, published an article about the Hydrogen Reformer technology of Angstrom Advanced Inc. This is another recognition of Angstrom’s cutting edge technical innovation and its fast expanding fame in the industry: “Here and now gasification plants have the functionality to make the hydrogen economy a real possibility. Greatly reducing the cost of hydrogen production by using renewable resources and advanced, reliable processing techniques enables a gasification plant to produce valuable hydrogen product from waste materials. While the technology is available to enable this functionality, however, most plants opt to simply create SynGas (a mixture of hydrogen and carbon monoxide.) However, as market demand for hydrogen increases in parallel with the stationary and transportation fuel cell industry, gasification facilities will likely be the top producer of renewable hydrogen fuel – mostly due to the low cost of production and the scalability of plants. This paper will discuss minor changes to gasification plants that plant operators can implement which will maximize the value of their assets, and enable them to easily create a product with higher purity and productivity.
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Thursday, November 14, 2013
Hydrogen Plant by Natural Gas Reforming
Hydrogen Generating Plant by Natural Gas Reforming
www.angstromadvancedinc.com
Call for more Information781.519.4765
Request an Estimate
Prior to pressurization, desulfurization, and mixing with aqueous vapor, natural gas is passed through a special reformer which is packed with a catalyst for cracking and reforming the effluent mixture of hydrogen, carbon dioxide and carbon monoxide. After part of the heat is recovered, hydrogen will be obtained by removing excess carbon monoxide from the reformed effluent. The shift gas is then purified further through pressure swing adsorption (PSA), to obtain pure hydrogen.
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Specifications
| Gas Treatment | 50-20000 Nm3/h |
| Adsorption Pressure | 1.3MPA-2.0MPA |
| H2 purity % | 99-99.999% |
Wednesday, November 13, 2013
Angstrom Advanced Hydrogen Generating Plant by Water Electrolysis
Hydrogen Generating Plant by Water Electrolysis
www.angstromadvancedinc.com
Call for more Information781.519.4765
Request an Estimate
Hydrogen electrolyte and oxygen electrolyte circulate separately, hydrogen electrolyte pumps into hydrogen cell directly and oxygen electrolyte pumps into oxygen cell directly, and therefore gets higher purity of hydrogen and oxygen gas.
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Specifications
| H2 capacity | 2-600 Nm3/h |
| O2 capacity | 1-300 Nm3/h |
| H2 purity % | >99.9 |
| O2 purity % | >99.5 |
| Power consumption (DC) | < 4.5 kw.h/m3H2 |
| Electrolyte | Pressurized |
| Work pressure | 0.5-3.0MPa |
Angstrom Advanced Hydrogen Generating Plant by Methanol Decomposition
Hydrogen Generating Plant by Methanol
www.angstromadvancedinc.com
For more information please call: 781.519.4765
Request an Estimate
Hydrogen generation by methanol decomposition was developed in the last two decades. This technology features low cost, simple user friendly operation and very easy maintenance.
· - Methanol is converted to CO and H2 with the action of the catalyst;
· - CO and H2O are converted to CO2 and H2 with the action of the catalyst;
· - CO2 and trace CO are separated from the decomposed gases by PSA technology, and high purity of H2 is generated.
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Specifications
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Hydrogen output
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50~3000m3/h
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Pressure
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0.8-2.0 MPa
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Purity %
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99.9%-99.9995%
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Angstrom Advanced Pressure Swing Adsorption Hydrogen Generating Plant
Hydrogen Generating Plant by PSA with H2 Purifying System
www.angstromadvancedinc.com
For more information please call: 781.519.4765
Request an Estimate
Pressure Swing Adsorption (PSA) is used to separate hydrogen gas from other gases by feeding the gas under a certain pressure. This separation process occurs in an adsorption tower and is advantageous in its low cost, low capacity, minimal maintenance requirements and user-friendly interface. The H2 Purifying System removes oxygen from hydrogen via a catalyst to obtain high purity H2 after adsorption and drying through the dust filter. The system can remove oxygen down to levels of 1ppm. Through one step of purification, the purity of the hydrogen generated can reach between 99.999~99.9999% and the dew point can be lower than -70°C; Through a second purification step, impurities can be lowered down to less than 0.1ppm and dew point can be lowered to -90°C.
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Specifications
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Gas Treatment
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10-5000NM3/H
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Pressure
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≤0.8Mpa
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H2 purity %
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>98-99.999%
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Dew Point
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≤-60°C
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Oxygen Content
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≤1ppm
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Angstrom Advanced Hydrogen Generating Plant by Ammonia Decomposition
Hydrogen Generating Plant by Ammonia Decomposition
www.angstromadvancedinc.com
For more information please call: 781.519.4765
Request an Estimate
The Hydrogen Generating Plant by Ammonia Decomposition offers a variety of benefits. The system is low cost, has a long service life, simple operation, compact structure, small coverage and simple installation. The system vaporizes liquid ammonia, and heats it with a catalyst until decomposition occurs, creating a mixture of gas consisting of 75% hydrogen and 25% nitrogen. Based on the principle that the molecular sieve adsorbs ammonia and water at different temperatures, high purity gas is produced by heat regenerating through the mixture working at normal temperature.
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Specifications
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Hydrogen Production
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5-500NM3/H
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Impurity Oxygen
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≤2ppm
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Residual Ammonia
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≤3ppm
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Dew Point
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≤-65°C
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Dew Point
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0.05-0.2Mpa
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