Thursday, December 15, 2016

Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer


 
Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer
 
Parameters:
Wavelength: 4000-400cm-1(2.5-25um)
Beam size: 1X34mm
Automated incident angle:35° to 90°,0.01°/Step
Functions/Features:
Film’s thickness, N & K measurement;
Resistivity measurements and doping profiles;
Identification of chemical bonds and buried layers investigation ;
Transmittance and reflectance;
 
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