Angstrom Advanced AA2000 Atomic Force Microscope

Features

High Performance:

• Atomic-scale of resolution
• Large sample size
• DSP(Digital Signal Processing) for great performance
• Real time operating system embedded
• Fast Ethernet connection with computer

Multi-Function:

• Atomic Force Microscope (AFM)
• Lateral Force Microscope (LFM)
• Force Analysis: I-V Curve, I-Z Curve, Force Curve
• Online real-time 3D image for better observation
• Multi-channel signals for more sample details
• Trace-Retrace scan, Back-Forward scan
• Multi-Analysis: Granularity and Roughness
• Data load-out for further analysis

Easy Operation:

• Fast automatically tip-engaging
• Easy change of the tip holder, for simple switching between STM and AFM
• Full digital control, auto system status recognition
• Software-based sample movement
• Nano-Movie function: Continuous data collection, storage and replay
• Modularized design for convenient maintenance and future upgrades

Specifications

 

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